Vacuum test fixtures are suitable for contacting electronic assemblies with a high throughput of test specimens. In this case, it is a vacuum multifunctional system, a combination of housing incl. test system interface and an exchangeable set expanded to customer requirements. The requirement includes an electrical design for bi-level testing, a 2-stage contacting system that combines function test (FCT) and in-circuit test (ICT).
The vacuum fixture is designed according to customer specifications for a Teradyne GR-086-3 interface. In general, all common interfaces and test systems are possible here.
In addition to extra hardware provided by the customer, a ground plate, a stroke counter and several LEDs have been installed. The customer-specific wiring includes the marking of sleeves with colored shrink tubing. Thanks to its modular design, this multifunctional system offers various options for contacting PCBs. In this case, a suitable vacuum cover including cover switch is used.
Special feature: Bi-level & vacuum cover
Fixture type: Vacuum changing system
Test type: ICT & FCT
Usable area: 310x200 mm
Contact force: 900 N
Parallel stroke: 6,5 mm (1. level) / 11,5 mm (2. level)
Test points: 450