Special
Special test procedure
Special
Special test procedure
If you are looking for individual solutions for complex testing requirements, we are the perfect partner for you. As specialists for special solutions, we have many years of experience in the development and implementation of tailor-made solutions for our customers. Our experts have in-depth knowledge of electronics, mechanics, software and design. We offer you comprehensive advice and support in the development and implementation of your projects - from brainstorming and concept development to implementation and commissioning. Our strength is the ability to understand complex requirements and develop creative, tailor-made solutions that perfectly meet our customers' needs. We work closely with our customers to ensure that the solutions are not only technically perfect, but also meet business requirements.
Our goal is to offer our customers high-quality special solutions that increase their productivity, reduce costs and create competitive advantages.
In addition to the standard test types FCT, ICT, HF, etc., there are numerous other types of tests in the electrical industry. GPS Prüftechnik develops and produces the right test fixture for a wide variety of requirements. This includes Boundary Scan, LED testing and Flash programming. We will find the perfect solution. Contact us!
This test procedure usually takes place during the development process. The results characterize the robustness and reliability of a product and can influence design and production.
It is a qualitative test method in which electronic and electromechanical assemblies are exposed to accelerated aging. In this way, any weak points and/or design errors can be identified and eliminated at an early stage. The simulation of an accelerated aging process works via temperature fluctuations to which the test specimen is exposed. The standard temperature ranges are -40°C and +85°C. Intervals from -100°C to +200°C form the limit for this test procedure.
*HALT - Highly Accelerated Life Test
*HASS - Highly Accelerated Stress Screening
The LED DCA can be used to quickly and automatically measure the color of light-emitting diodes (LEDs) and the intensity of the light. For this purpose, a master (Golden Board) is taught and the permitted deviation tolerance is saved. The subsequent check behaves along this tolerance and measures any deviations. In this way, faulty LEDs can be easily sorted out. This is a complete LED test system, consisting of a fixture, computer and software, individually made to meet your requirements. Feel free to contact us about this product.
The test procedure is an electrical test procedure for electronic assemblies to identify sources of error without physical access to the test object. In addition to the combination of analog and digital assemblies, assemblies with a high proportion of digital components are particularly suitable. Test access is via Boundary Scan cells. Signals are injected onto the test object via defined paths and measured, so that no test points or test needles are required.
Boundary scan (also known as JTAG scan) is an integrated circuit test method that allows the function and integrity of digital circuits to be tested and monitored. The boundary scan technology uses a special input and output interface (boundary scan cell) placed on each pin of the chip to test and debug the chip's internal circuitry.
It can be used to identify problems in the wiring, layout, and connection of chips on a board. It can also help detect manufacturing defects such as shorts, opens, and bad connections. Boundary Scan allows the chip to be tested in a "virtual environment" by injecting test vectors into the chip through the Boundary Scan cells and monitoring the outputs. Boundary scan is also useful for in-system programming of chips and debugging errors on a board or in a system. It can also be used to check connections between different chips on a board.
This technology has been in widespread use for many years and is part of the IEEE 1149.1 standard. Many modern ICs feature boundary scan technology to improve testability and debugging.
Flash programming test fixtures are specifically designed for the purpose of programming or testing flash memory in electronic devices. The test fixture serves as an interface between the flash memory and the programming device or the test system. It consists of circuit board equipped with connectors or terminals to connect the flash memory. The board also contains the necessary circuitry to route the signals from the programmer or test system to the flash memory and vice versa. The Flash Programming Test Fixture can be made in various sizes and shapes to meet the needs of different devices or applications. It can run as a single fixture or as a multi-site fixture to program or test multiple devices simultaneously. Flash programming is an important part of test systems in the electronics industry. It allows to ensure the functionality and reliability of electronic devices by performing flash memory programming or verification.
